Centres Científics i Tecnològics UB

Scanning electron microscopy (SEM)

  • Conventional SEM (secondary and retro-dispersed electrons)
  • FE-SEM (high resolution)
  • ESEM (low vacuum)
  • X-ray microanalysis
  • SEM-CL cathodoluminescence
  • BSED electron diffraction
  • Cryo-SEM
  • Nanolithography
  • Preparation of samples for SEM (C evaporates, Au coatings, critical point dehydration and cryodessication)
  • Solid material observation and analysis
  • Technical assistance in all available techniques
  • Treated surfaces
  • Solid material characterization
  • Rock and mineral characterization
  • Particles and contaminants
  • Pharmaceutical products
  • Quality control

Surname Name Location Phone number Email
ARTIAGA TORRES DAVID CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021701 dartiaga@ccit.ub.edu
GARCIA VEIGAS (*) JAVIER CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021701 veigas@ccit.ub.edu

      (*) for more information



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