Scanning electron microscopy
- Conventional SEM (secondary and retro-dispersed electrons)
- FE-SEM (high resolution)
- ESEM (low vacuum)
- X-ray microanalysis
- SEM-CL cathodoluminescence
- BSED electron diffraction
- Cryo-SEM
- Nanolithography
- Preparation of samples for SEM (C evaporates, Au coatings, critical point dehydration and cryodessication)
- Solid material observation and analysis
- Technical assistance in all available techniques
- Treated surfaces
- Solid material characterization
- Rock and mineral characterization
- Particles and contaminants
- Pharmaceutical products
- Quality control
| Surname | Name | Location | Phone number | |
| ARTIAGA TORRES | DAVID | CCiTUB - C/ Lluis Solé i Sabarís, 1-3 | 934021701 | dartiaga@ccit.ub.edu |
| GARCIA VEIGAS (*) | JAVIER | CCiTUB - C/ Lluis Solé i Sabarís, 1-3 | 934021701 | veigas@ccit.ub.edu |
| LIZANDRA BURSET | RAQUEL | CCiTUB - C/ Lluis Solé i Sabarís, 1-3 | 934021701 | rlizandra@ccit.ub.edu |
(*) for more information
Highlighted links: