Centres Científics i Tecnològics UB

X-ray diffraction (XRD)

  • XRD of polycrystalline materials in geometries of reflection and transmission.
  • XRD of polycrystalline materials in geometries of reflection and transmission according to temperature (thermodiffractometry).
  • XRD of monocrystalline materials through the resolution of crystalline structures.
  • XRD in grazing incidence.
  • XRD with texture goniometry.
  • XRD of heteroepitaxial fine layers in high and low resolution.
  • X-ray reflectometry.
  • Determination of crystalline structures; crystallographic characterizations.
  • Analysis of crystallinity.
  • Analysis of isostructuralism, isomorphism and miscibility in solid state.
  • Qualitative analysis of crystalline phases.
  • Semi-quantitative and quantitative analysis of crystalline phases (and possibly of amorphous phases).
  • Analysis of phases based on the depth of materials in fine layers.
  • Polymorphism and pseudopolymorphism studies.
  • Thermodiffractometry: studies of phase transitions, monitoring of solid state reactions, thermal dilatation, etc.
  • Diffraction profile adjustment: Rietveld method.
  • Microstructural analysis: dimensions of diffraction domains and microdeformations.
  • Determination of thicknesses, densities and rigidity of fine layer materials.
  • Analysis of textures and preferential orientations.
  • Determination of residual stress.
  • Determination of tension/relaxation states in heteroepitaxial layers.
  • Determination of compositions in the heteroepitaxy of semiconductors.
  • Determination of monocrystalline orientation.
  • In-plane diffraction.
  • Studies of polymorphism in pharmaceuticals and pharmaceutical specialities.
  • Studies of isostructuralism and isomorphism in pharmaceuticals and pharmaceutical specialities.
  • Determination of crystalline structures of new synthetic materials.
  • Analysis of phases of concrete, cements, aggregates and similar products.
  • Qualitative and quantitative analysis of geological materials.
  • Characterizations of coating and fine layer materials.
  • Determination of residual stress in steel, other metals and coatings.


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