XPS/UPS
- Photoelectron spectroscopy (ESCA or XPS)
- Auger microscopy (SAM)
- Ultraviolet photoelectron spectroscopy (UPS)
- Elemental chemical and semi-quantitative analysis of surfaces (firs 5-10 nanometres of the surface of a material)
- Specialized spectral treatment to accurately interpret the information obtained
- Analysis of the contributions of different chemical states of the same element (for examples oxidation versus metal components)
- Studies of problems originating from design and production processes (such as surface contamination) in, for example, paints, chemical products, pharmaceuticals, wiring, metal coatings and dental implants
- Profilometric studies of materials with multi-layered structures (up to a maximum of 0.5 micrometres).
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