JEM 2010F
The JEM 2010F transmission electron microscope is equipped with a field‑emission electron gun, providing higher beam intensity and improved resolution in both parallel‑beam mode (HRTEM) and scanning mode (STEM).
The microscope includes an energy‑filtering system for electron energy‑loss spectroscopy (EELS). Beyond chemical composition analysis, this technique enables the determination of valence and coordination states through fine‑structure analysis of ionization edges, as well as access to optoelectronic properties of materials by analysing the low‑loss region of the spectra.
Equipment Features
• Accelerating voltage: 200 kV
• Field‑emission electron gun (FEG)
• Gatan ORIUS SC200 CCD camera
• STEM unit with bright‑field (BF) and high‑angle annular dark‑field (HAADF) detectors
• Energy filter for electron energy‑loss spectroscopy (GIF)
• Electron‑beam precession system (DIGISTAR)
• Phase and crystal‑orientation mapping system (ASTAR)
• Crystal‑strain mapping system (TOPSPIN)
• JEOL tomography holder (±70°)
• Nanofactory TEM‑STM holder for in situ electrical measurements
Technology Applications
• HRTEM imaging of crystalline materials (nanoparticles, nanowires, thin films, etc.)
• Chemical mapping using STEM‑EELS
• Crystal orientation and phase mapping (ASTAR)
• Strain mapping (TOPSPIN)
Location
The JEM 2010F TEM is managed by the Electron Microscopy and Related Techniques Unit and is located on the Diagonal Campus, in the main building of the CCiTUB.