Centres Científics i Tecnològics UB

TEM applied to materials

  • TEM to obtain high-resolution images (200 kV FEG).
  • TEM to obtain atomic number contrast images (STEM/HAADF).
  • TEM to obtain precession diffraction patterns.
  • TEM to obtain element spectra and maps showing energy loss (EELS).
  • TEM to obtain element spectra and maps with X-rays (EDS).
  • TEM to obtain tomographic series for 3D reconstructions.
  • Preparation of electron transparent samples in plan-view and cross-section with ionic and electrolytic thinning and preparation of suspensions.
  • Preparation of electron transparent samples by FIB.
  • Training:
    • Basic and advanced training in the self-service handling of TEM instruments.
    • In the preparation of electron transparent samples for self-service processing.
    • In the interpretation of images, spectra and diffractions.
  • Advice on how to obtain satisfactory results for users working with centre assistance.
  • TEM sample analyses conducted fully by the centre for limited quantities of samples.
  • Elemental and structural analysis of nanometric precipitates.
  • Morphological and elemental analysis of catalytic nanoparticles and mesoporous materials.

Surname Name Location Phone number Email
BARBA FERRER MARIA CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 mariabarba@ccit.ub.edu
LÓPEZ CONESA (*) LLUÍS CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 llopez@ccit.ub.edu
MARTINEZ RUIZ GEMA MARTA CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 gema@ccit.ub.edu
MATA RODRIGUEZ FÈLIX CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 felix@ccit.ub.edu
MENDOZA GOLZALVEZ JUAN JOSE CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 mendoza@ccit.ub.edu
REBLED CORSELLAS JOSEP MANEL CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 jmrebled@ccit.ub.edu

      (*) For more information



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