JEOL JSM 6510 SEM
The JEOL JSM 6510 SEM is a thermionic Scanning Electron Microscope.
Equipment Features
• Pentafex‑INCA EDS detector (Oxford Instruments)
• E‑T secondary electron detector (in‑camera)
• Backscattered electron detector (in‑camera)
• ALTO1000 Gatan cryo‑unit (Cryo‑SEM)
Technology Applications
• High‑vacuum microscopy
• Microscopic characterization of materials
• Qualitative microanalysis of solid materials
• Observation and microanalysis of frozen hydrated samples
Location
The JSM 6510 SEM is managed by the Electron Microscopy and Related Techniques Unit and is located on the Diagonal Campus, in the main building of the CCiTUB.