JSM 7100-F with EDS

The JSM 7100‑F is a Field Emission Scanning Electron Microscope equipped with EDS.

Equipment Features

• Pentafex‑INCA EDS detector (Oxford Instruments)
• E‑T secondary electron detector (in‑camera)
• Backscattered electron detector (in‑camera)
• Cathodoluminescence spectrometer (MONOCL4, Gatan)

Technology Applications

• High‑resolution microscopy in high vacuum
• Microscopic characterization of materials
• Qualitative microanalysis of solid materials

Location

The JSM 7100‑F microscope equipped with EDS is managed by the Electron Microscopy and Related Techniques Unit and is located on the Diagonal Campus, in the main building of the CCiTUB.