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Electron probe X-ray microanalysis (EPMA) using wavelength dispersive X-ray spectrometry (WDS) and/or energy dispersive spectrometry (EDS). |
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Precision elemental analysis (qualitative and quantitative).
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Online profiles and composition maps (qualitative and quantitative).
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Precision and online analysis of composition and thickness of fine layers and multi-layers.
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Images of secondary, retro-dispersed and absorbed electrons.
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Specific mineral calculations (structural formulas, end stages of replacements, solid solutions, etc.).
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Carbon coating.
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Study of indicator minerals for mineral exploration (gold, diamonds, etc.).
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Analysis of industrial minerals; soil and sediment analysis (environmental studies).
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Analysis of thin films and multilayers.
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Characterization of the microstructure of steel, alloys and metals; analysis of defects and precipitates; welding analysis.
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Quality control for glass products, fertilizers, etc.
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Surname
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Name
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Location
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Phone number
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Fax
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Email
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LLOVET XIMENES
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XAVIER
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CCiTUB - C/ Lluis Solé i Sabarís, 1-3
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934037203
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xavier@ccit.ub.edu
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(*) For more information
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