Centres Científics i Tecnològics UB

SPM nano-techniques(AFM, STM) and interferometry-confocal

Scanning probe microscopy (SPM) techniques (AFM, LFM, MFM, EFM, c-AFM, TUNA)
Force spectroscopy (nanomechanical properties)
Interferometric microscopy
Confocal microscopy
Optical microscopy
Topographic analysis with atomic resolution
Measurement of nanomechanical properties
Measurement of physical properties: conductivity, magnetic domains and surface charges
Measurement of compositional contrast: quantitative phase and friction (LFM)
Measurements using advanced optical microscopy (confocal, interferometry, optical)
Surface rugosity, nm- to mm-scale measurements
Analysis of nano-scale metal, polymer, ceramic and composite samples
Training courses for self-service users
Scientific studies of nano-scale materials
Surface topography of materials.
3D topography of implants.
Analysis of mechanical properties of cosmetic products.
Measurement of compositional contrast.
Measurement of physical properties (electric, magnetism).
Measurement of thickness of thin conductive or ferromagnetic layers (Electronics / Spintronics).
Surface texture on optical surfaces (Optics).
Wear of mechanical pieces. Bearings, friction pieces, ...... (Mechanical).
Analysis of the surface finish of machined pieces or electropolished materials (Tribology).
Surface solid texture for food or cosmetic applications (Industry Formulation ).
Surface degradation of biocompatible materials (Bio).
Topopgraphy of biological materials (teeth, bones, skin, ....).
Applications of 3D roughness parameters (Tribology, odontology, implantology,
chemistry, optics, ...).
Nanomechanical properties Studies(adhesion, etc.) with humidity control.
Study of physical and morphological proporties for nanosafety applications.

Surname Name Location Phone number Fax Email
DIAZ MARCOS (*) JORDI CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934020593/
934021398 jdiaz@ccit.ub.edu
VILLUENDAS LATORRE ARANZAZU CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934020593/
934021398 aranzavila@ccit.ub.edu

      (*) For more information

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