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TEM applied to materials
TEM to obtain high-resolution images (200 kV FEG).
TEM to obtain atomic number contrast images (STEM/HAADF).
TEM to obtain precession diffraction patterns.
TEM to obtain element spectra and maps showing energy loss (EELS).
TEM to obtain element spectra and maps with X-rays (EDS).
TEM to obtain tomographic series for 3D reconstructions.
Preparation of electron transparent samples in plan-view and cross-section with ionic and electrolytic thinning and preparation of suspensions.
Preparation of electron transparent samples by FIB.
Training:
Basic and advanced training in the self-service handling of TEM instruments.
In the preparation of electron transparent samples for self-service processing.
In the interpretation of images, spectra and diffractions.
Advice on how to obtain satisfactory results for users working with centre assistance.
TEM sample analyses conducted fully by the centre for limited quantities of samples.
Elemental and structural analysis of nanometric precipitates.
Morphological and elemental analysis of catalytic nanoparticles and mesoporous materials.
Surname
Name
Location
Phone number
Email
BARBA FERRER
MARIA
CCiTUB - C/ Lluis Solé i Sabarís, 1-3
934021695
mariabarba@ccit.ub.edu
LÓPEZ CONESA (*)
LUÍS
CCiTUB - C/ Lluis Solé i Sabarís, 1-3
934021695
llopez@ccit.ub.edu
MARTINEZ RUIZ
GEMMA MARTA
CCiTUB - C/ Lluis Solé i Sabarís, 1-3
934021695
gema@ccit.ub.edu
MATA RODRIGUEZ
FELIX
CCiTUB - C/ Lluis Solé i Sabarís, 1-3
934021695
felix@ccit.ub.edu
MENDOZA GOLZALVEZ
JUAN JOSE
CCiTUB - C/ Lluis Solé i Sabarís, 1-3
934021695
mendoza@ccit.ub.edu
(*) For more information
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