Transmission electron microscopy (TEM)
- TEM to obtain high-resolution images (200 kV FEG).
- TEM to obtain atomic number contrast images (STEM/HAADF).
- TEM to obtain precession diffraction patterns.
- TEM to obtain element spectra and maps showing energy loss (EELS).
- TEM to obtain element spectra and maps with X-rays (EDS).
- TEM to obtain tomographic series for 3D reconstructions.
- Preparation of electron transparent samples in plan-view and cross-section with ionic and electrolytic thinning and preparation of suspensions.
- Preparation of electron transparent samples by FIB.
- Training:
- Basic and advanced training in the self-service handling of TEM instruments.
- In the preparation of electron transparent samples for self-service processing.
- In the interpretation of images, spectra and diffractions.
- Advice on how to obtain satisfactory results for users working with centre assistance.
- TEM sample analyses conducted fully by the centre for limited quantities of samples.
- Elemental and structural analysis of nanometric precipitates.
- Morphological and elemental analysis of catalytic nanoparticles and mesoporous materials.
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