Centres Científics i Tecnològics UB

TEM applied to materials

TEM to obtain high-resolution images (200 kV FEG).
TEM to obtain atomic number contrast images (STEM/HAADF).
TEM to obtain precession diffraction patterns.
TEM to obtain element spectra and maps showing energy loss (EELS).
TEM to obtain element spectra and maps with X-rays (EDS).
TEM to obtain tomographic series for 3D reconstructions.
Preparation of electron transparent samples in plan-view and cross-section with ionic and electrolytic thinning and preparation of suspensions.
Preparation of electron transparent samples by FIB.
Training:
Basic and advanced training in the self-service handling of TEM instruments.
In the preparation of electron transparent samples for self-service processing.
In the interpretation of images, spectra and diffractions.
Advice on how to obtain satisfactory results for users working with centre assistance.
TEM sample analyses conducted fully by the centre for limited quantities of samples.
Elemental and structural analysis of nanometric precipitates.
Morphological and elemental analysis of catalytic nanoparticles and mesoporous materials.

Surname Name Location Phone number Email
BARBA FERRER MARIA CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 mariabarba@ccit.ub.edu
LÓPEZ CONESA (*) LLUÍS CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 llopez@ccit.ub.edu
MARTINEZ RUIZ GEMA MARTA CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 gema@ccit.ub.edu
MATA RODRIGUEZ FÈLIX CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 felix@ccit.ub.edu
MENDOZA GOLZALVEZ JUAN JOSE CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 mendoza@ccit.ub.edu
REBLED CORSELLAS JOSEP MANEL CCiTUB - C/ Lluis Solé i Sabarís, 1-3 934021695 jmrebled@ccit.ub.edu


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