TEM applied to materials

	TEM to obtain high-resolution images (200 kV FEG).
	TEM to obtain atomic number contrast images (STEM/HAADF).
	TEM to obtain precession diffraction patterns.
	TEM to obtain element spectra and maps showing energy loss (EELS).
	TEM to obtain element spectra and maps with X-rays (EDS).
	TEM to obtain tomographic series for 3D reconstructions.
	Preparation of electron transparent samples in plan-view and cross-section with ionic and electrolytic thinning and preparation of suspensions.
	Preparation of electron transparent samples by FIB.

	Training:
		Basic and advanced training in the self-service handling of TEM instruments.
		In the preparation of electron transparent samples for self-service processing.
		In the interpretation of images, spectra and diffractions.
	Advice on how to obtain satisfactory results for users working with centre assistance.
	TEM sample analyses conducted fully by the centre for limited quantities of samples.

	Elemental and structural analysis of nanometric precipitates.
	Morphological and elemental analysis of catalytic nanoparticles and mesoporous materials.

Surname	Name	Location	Phone number	Email
BARBA FERRER	MARIA	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021695	mariabarba@ccit.ub.edu
LÓPEZ CONESA (*)	LLUÍS	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021695	llopez@ccit.ub.edu
MARTINEZ RUIZ	GEMA MARTA	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021695	gema@ccit.ub.edu
MATA RODRIGUEZ	FÈLIX	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021695	felix@ccit.ub.edu
MENDOZA GOLZALVEZ	JUAN JOSE	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021695	mendoza@ccit.ub.edu
REBLED CORSELLAS	JOSEP MANEL	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021695	jmrebled@ccit.ub.edu

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