XPS/UPS

• Photoelectron spectroscopy (ESCA or XPS)
• Auger microscopy (SAM)
• Ultraviolet photoelectron spectroscopy (UPS)

• Elemental chemical and semi-quantitative analysis of surfaces (firs 5-10 nanometres of the surface of a material)
• Specialized spectral treatment to accurately interpret the information obtained

• Analysis of the contributions of different chemical states of the same element (for examples oxidation versus metal components)
• Studies of problems originating from design and production processes (such as surface contamination) in, for example, paints, chemical products, pharmaceuticals, wiring, metal coatings and dental implants
• Profilometric studies of materials with multi-layered structures (up to a maximum of 0.5 micrometres).

Surname	Name	Location	Phone number	Email
CALVO BARRIO (*)	LORENZO	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934037203	lorenzo@ccit.ub.edu

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