Centres Científics i Tecnològics UB

EELS Spectroscopy(Electron Energy Loss Spectroscopy) for materials characterization

Information

In Transmission Electron Microscopy (TEM), incident electron suffers both inelastic and elastic collisions when go across the thin sample in solid state being characterized. In the case of inelastic collision, the incident electron transfers part of its energy to the electrons in the sample. The amount of energy loss can be measured with a magnetic filter at the bottom of the column, resulting in an electron energy loss spectrum or EELS spectrum. Today the EELS has become an important tool in materials science due to the gradual reduction of the characteristic scale involved in the development of the discipline, and also thanks to improved instruments held in recent years both in electron microscopy in general and in the EELS specially.

Date: 05/15/2013
Hour: 10:30h a 11:30h
Location: Aula dels CCiTUB. Edifici CCiTUB, 1ª planta. c/Lluís Solé i Sabarís, 1-3. Barcelona
Fee: Free
Speaker: Sonia Estradé, TEM applied to materials technology of the CCiTUB


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