Centres Científics i Tecnològics UB

Advanced Course on Nanomechanical measurements by AFM


Objectives Methodology Adressed to Date Location


 Course Objectives

Obtain qualitative and quantitative nanomechanical parameters from all kinds of samples by AFM-related modes, both in air and in liquid operation. Attendants are highly encouraged to bring their samples so applications engineers can solve their specific problems.

Technical talks by applications engineers and renowned researchers will focus the topic and hands-on demos with cutting-edge AFMs will be devoted to show the assistants the possibilities of the technique.
The reduced number of assistants (15 per session) ensures maximum interaction between experts and students.

 Adressed to

The course offers specific training courses in Atomic Force Microscopy for PhD students, post-docs or scientists working on Life Sciences and Materials Science. Indicated to new users in AFM or users that need advanced theoretical and practical training in one specific operation mode.

 Methodology

Technical and scientific talks: 3 hours
Practical hands-on demos: 5 hours
Reduced groups: 15 persons / day.

 Date

19th September: 1st Workshop
20th September: 2nd Workshop

 Location

CCiTUB Building
C/ Lluís Solé i Sabarís, 1
08028 Barcelona
mapa Campus Diagonal


8.30-9.00hRegistration
9.00-09.30hIntroduction by BRUKER Traditional Measuring Techniques: Force Spectroscopy, Force Volume, Contact-Friction
9.30-10.15hOral presentation by invited speaker
     Jordi Fraxedas (CIN2), 19th september
     Gerard Oncins (CCiTUB), 20th september
10.15-11.00hCoffee Break
11.00-12.00hTechnical/practical talk 1: HarmoniX and Peak Force QNM
12.00-13.00hTechnical/practical talk 2: High Resolution images using Peak Force Tapping
13.00-13.30hPractical solutions to your samples: roundtable discussion
13.30-15.00hLunch (not included)
15.00-18.00hHands-on demo by BRUKER (AFM system: Multimode 8)

Registration closed.

If you need more information about this course, please, contact: nano@ccit.ub.edu.

For more information:

SPM nano-techniques(AFM, STM) and interferometry-confocal technology. CCiTUB.


Speakers

Dr. Jordi Díaz. Tecnologia de Microscòpia de sonda pròxima (AFM, STM) i interferometria-confocal. CCiTUB

Mickael Febvre (applications engineer, Bruker).

Dr. Jordi Fraxedas (group leader of the "Small Molecules on Surfaces in ambient and pristine conditions Group" (CIN2)). Titile of the talk: Nanoindentation of carbon nanotubes by AFM: how to extract quantitative energetic information.

Dr. Gerard Oncins. Tecnologia de Microscòpia de sonda pròxima (AFM, STM) i interferometria-confocal. CCiTUB



Organized by:

Centres Científics i Tecnològics
Universitat de Barcelona
Director: Dr. Jose Ramón Seoane Trigo

Coordinator:
Dr. Jordi Díaz
SPM nano-techniques(AFM, STM) and interferometry-confocal technology. CCiTUB.
BRUKER











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