JEM 2100

The JEM 2100 transmission electron microscope is a highly versatile instrument that enables the characterization of samples in both materials science and life sciences. It provides morphological and structural information in imaging mode (HRTEM) and diffraction mode (SAED or PED), as well as chemical information through XEDS spectroscopy.

Equipment Features

• Accelerating voltage: 120 kV – 200 kV
• LaB₆ thermionic electron gun
• Gatan ORIUS SC1000A CCD camera
• STEM unit with bright‑field (BF) and high‑angle annular dark‑field (HAADF) detectors
• XEDS microanalysis system (Oxford Instruments)
• Electron‑beam precession system (DIGISTAR)
• Phase and crystal‑orientation mapping system (ASTAR)
• Crystal‑strain mapping system (TOPSPIN)
• Portamuestras JEOL para tomografía (±70°)
• Nanofactory TEM‑STM holder for in situ electrical measurements

Technology Applications

• Morphological characterization of samples for both materials science and biology
• Structural characterization of crystalline materials (HRTEM, SAED, PED)
• Chemical composition mapping (STEM‑XEDS)
• Phase and crystal‑orientation mapping (ASTAR)

Location

The JEM 2100 TEM is managed by the Electron Microscopy and Related Techniques Unit and is located on the Diagonal Campus, in the main building of the CCiTUB.