Centres Científics i Tecnològics UB

Scanning Probes Microscopies: New trends and applications

Information

Atomic force microscope (AFM) has revolutionized contemporary microscopy and has given researchers a powerful tool to study materials at submicron scale. This seminar will give a brief introduction about atomic force microscope (configuration, classical modes of work and general applications) and show its potential for analysis under different experimental conditions to obtain structural and compositional nanoscale different types of samples. We will see new ways of working and new applications that have been developed last years. At last we’ll introduce new set-ups based on the combination of different microscopy techniques (AFM + Raman, IR + AFM, etc) which represent a major technological revolution.

Date: 05/08/2013
Hour: 10:30h a 11:30h
Location: Aula dels CCiTUB. Edifici CCiTUB, 1ª planta. c/Lluís Solé i Sabarís, 1-3. Barcelona
Fee: Free
Speaker: Jordi Díaz, SPM nano-techniques(AFM, STM) and interferometry-confocal technology of the CCiTUB


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