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The workshop is aimed at all users interested in the use of AFM microscopy for the advanced characterization of new materials. Attendees will have the opportunity to check the multiple possibilities of this technique during practical sessions with the latest generation AFM Dimension Icon platform.
Programa:
9.00 – 9.15
Welcome
9.15 – 9.30
Introduction and presentation
9.30 – 10.15
Presentation 1 – ICMAB-CSIC
10.15 – 11.00
Presentation 2 - IMB-CNM-CSIC
11.00 – 11.30
Coffee break
12.00 – 13.30
Datacube presentation– Mickaël Febvre, Bruker Nano Surfaces
13.30 – 15.00
Pause - Lunch
15.00 – 17.30
“Hands on session” – Dimension Icon AFM
 Fee
Free, those interested in attending the event should send an email to instrumat@telstar.com, with the subject “2018 AFM Workshop Barcelona”, and indicating the following data:
- Name and surname
- Institution / Organization
- Email
- Phone
June 12th, 9:00 to 17:30h.
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Lugar
Universitat de Barcelona
Physics and Chemistry Faculty
C. de Martí i Franquès, 1
08028, Barcelona
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Organized by: |
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Centres Científics i Tecnològics
Universitat de Barcelona
Director: Dr. José Ramón Seoane Trigo
Coordinator:
Dra. Jordi Díaz
SPM nano-techniques (AFM, STM) and interferometry-confocal.
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AZBIL TELSTAR
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BRUKER
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Collaborates:
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IN2UB
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Contents |
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