Noticias
21.10.2020Publicación del artículo "Electron probe microanalysis: a review of recent developments and applications in materials science and engineering"
El Dr. Xavier Llovet, responsable de la Unidad Microsonda Electrónica dels CCiTUB, de los CCiTUB, juntamente con colegas de la Universidad de Wisconsin-Madison (USA) y de la empresa Oxford Instruments (UK), ha publicado el artículo "Electron probe microanalysis: a review of recent developments and applications in materials science and engineering" en la prestigiosa revista Progress in Materials Science (factor de impacto = 31.56).
El artículo es una extensa review que describe los avances metodológicos del análisis de materiales con microsonda electrónica que se han producido en los últimos años y sus aplicaciones más significativas en el campo de la ciencia de materiales e ingeniería.
Este artículo muestra la importancia de la investigación metodológica en las técnicas de análisis y caracterización para el avance de las disciplinas científicas. Este tipo de investigación metodológica se lleva a cabo en los centros de soporte a la investigación e innovación tecnológica como los CCiTUB.
El abstract del artículo es:
Electron probe microanalysis (EPMA) is a microanalytical technique widely used for the characterization of materials. Since its development in the 1950s, different instrumental and analytical developments have been made with the aim of improving the capabilities of the technique. EPMA has utilized crystal diffractors with gas detectors (wavelength-dispersive spectrometers, WDS) and/or solid-state detectors (energy-dispersive spectrometers, EDS) to measure characteristic X-rays produced by an electron beam. In this review, we give an overview of the most significant methodological developments of EPMA that have occurred in the last three decades, including the incorporation of large area diffractors, field-emission guns, high-spectral resolution X-ray grating spectrometers, silicon drift detectors, as well as more powerful Monte Carlo simulations, which have opened a wide range of new possibilities for the characterization of materials using EPMA. The capabilities of the technique are illustrated by a selection of representative applications of EPMA to materials science and engineering, chosen to show the current merits and limitations of the technique. Given the lack of coverage in previous reviews of the excellent capabilities of EPMA for measurements of thin films and coatings, that topic is covered in detail. We finally provide ideas for new research opportunities using EPMA.
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