Scanning electron microscopy

	Conventional SEM (secondary and retro-dispersed electrons)
	FE-SEM (high resolution)
	ESEM (low vacuum)
	X-ray microanalysis
	SEM-CL cathodoluminescence
	BSED electron diffraction
	Cryo-SEM
	Nanolithography

	Preparation of samples for SEM (C evaporates, Au coatings, critical point dehydration and cryodessication)
	Technical assistance in all available techniques

	Treated surfaces
	Particles and contaminants
	Pharmaceutical products
	Quality control

Surname	Name	Location	Phone number	Fax	Email
ARTIAGA TORRES	DAVID	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021701	934021398	dartiaga@ccit.ub.edu
GARCIA VEIGAS (*)	JAVIER	CCiTUB - C/ Lluis Solé i Sabarís, 1-3	934021701	934021398	veigas@ccit.ub.edu

      (*) For more information