News
24.02.2021New dispersive X-Ray (EDS) Spectrometer in the Electronic Microscopy Unit (TEM-SEM)
Recently, a new dispersive X-Ray Spectrometer (EDS. Inca 250 Oxford Instruments) has been installed in the Scanning Electron Microscope JEOL JSM-7001F placed in the Electronic Microscopy Unit at Casanova Campus.
The application of this EDS technique in life science is not widely extended, but it opens several new possibilities. This new detector allows to perform quantitative and semiquantitative elemental analysis, detecting from Boron to Uranium, as well as create elements distribution maps.
EDS may be used to understand how an organism interacts with the chemistry in its environment, allowing for example the analyze of polluting element. Other applications may be the localization of nanoparticles in tissues.
This new accessory will allow CCiTUB users to acquire a more exhaustive knowledge of their samples, completing the morphologic information that is usually gotten with the Scanning Electronic Microscope (SEM).
