JSM 7001F
The JSM 7001F is a field‑emission scanning electron microscope that enables high‑resolution imaging by combining topographic and chemical‑contrast information, allowing comprehensive analysis of a wide variety of samples.
This scanning electron microscope is suitable for observing the surface of different types of samples, both biological and material‑based. It is particularly relevant for biomedical studies, as it can operate under low‑vacuum conditions, reducing electrostatic charging and enabling the analysis of non‑conductive samples without prior preparation.
Equipment Features
Electron Gun:
• Schottky‑type field emission, ZrO/W emitter – Mechanical and electromagnetic alignment/deflection
Resolution:
• Secondary electron detector – 1.2 nm at 30 kV, 3 nm at 1 kV
Accelerating Voltage:
• 0.5 to 30 kV in SEM mode
• 0.2 to 30 kV in GB‑L mode
Sample Stage Movement:
• X‑axis: 70 mm
• Y‑axis: 50 mm
• Z‑axis: 3 to 41 mm
• Tilt: –5° to +70°
• Rotation: 360°
Electron Detection System
• Secondary electron detector – collector, scintillator, light guide, and photomultiplier tube
• Backscattered electron detector – retractable
Low‑Vacuum System
• Chamber pressure – 10 to 50 Pa
• Resolution – 3 nm (at 30 kV, WD 6 mm) using the backscattered electron detector
Vacuum System
• Gun‑chamber isolation valve
• Vacuum pumps: ion, turbomolecular, rotary
Technology Applications
• High‑resolution imaging using the secondary electron detector
• Chemical‑contrast imaging using the backscattered electron detector (BSED)
• Imaging under both low‑vacuum and high‑vacuum conditions
Location
The JEOL JSM 7001F SEM is managed by the Electron Microscopy and Related Techniques Unit and is located on the Casanova Campus, at the Faculty of Medicine of the University of Barcelona.