News
11.15.2013
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The Workshop Análisis de Rugosidad y Textura Superficial has come to the end. It has been organized from CCiTUB in collaboration with Leica Microsystems and coordinated by technicians of the technology of Scanning Prove Microscopy. The attendees participated in theoretical and practical conferences and various round tables where they could share specific details on concepts of analysis and surface characterization, with special emphasis in the surface roughness, both 2D and 3D. Moreover information was given about the normative ISO4287 (2D) and ISO25178 (3D) applied to the new methods of measurement of surface without contact. The attendees also could bring samples and own materials for its examination during the practical sessions which offered an applied vision of the concepts introduced in the presentations. During the workshop the attendees could work in scoop with the newest and pointer interferometer/confocal microscope which are available in LEICA: the LEICA DCM8. This model, which will be launched to the market the next month, offers all the functionalities that the previous model has (the successful DCM3D) and much more news, among them, the incorporation of an array of LEDs which significantly improves the quality of the optical image, a much faster electronics and the improved software routines. | |
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