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Scanning electron microscopy (SEM) and Atomic Forces Microscopy (AFM) meeting at the CCiTUB.
Program:
9.00 – 9.30
Breakfast/ Coffee/ Registration
9.30 – 9.45
Introducción de Monocomp Instrumentación
9.45 – 10.30
Basics of SEM and EDX by José Alfonso Seisdedos Bayón, Director de Monocomp Instrumentación
10.30 – 11.00
Imaging surface topography: Understanding Atomic Force Microscopy (AFM) by Dr. Colin Grant, Hitachi SPM Sales & Applications Specialist
11.00 – 11.30
Coffee break
11.30 – 12.00
Hitachi’s wide varieties of SEM sample preparation methods and its applications by Mr. Yu Sugimoto Hitachi EM Sales Manager
12.00 – 12.30
Correlative Microscopy: Combined AFM & SEM for advanced materials characterisations by Dr. Colin Grant
12.30 – 13.15
Hitachi’s latest FE-SEM technology and its applications by Mr. Yu Sugimoto
13.15 – 13.30
Q&A/ Wrap-up
 Preu
Free access, registration required. Contact to:
Sr. Mario Seisdedos
Tel: +34 619 135 904
mario@monocomp-instrumentacion.com
June 18th, 9:00 to 13:30h.
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Location
Aula dels CCiTUB
Centres Científics i Tecnològics
Universitat de Barcelona
C/ Solé i Sabarís 1-3, 08023 Barcelona
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Organized by: |
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Centres Científics i Tecnològics
Universitat de Barcelona
Director: Dr. José Ramón Seoane Trigo
Coordinator:
Dra. Anna Vila
Transfer and National and International Relations of the CCiTUB.
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HITACHI
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MONOCOMP
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