Centres Científics i Tecnològics UB

Scanning electron microscopy (SEM) and Atomic Forces Microscopy (AFM)


Objectives Fee Date Location


 Objectives

Scanning electron microscopy (SEM) and Atomic Forces Microscopy (AFM) meeting at the CCiTUB.

Program:

9.00 – 9.30
Breakfast/ Coffee/ Registration
9.30 – 9.45
Introducción de Monocomp Instrumentación
9.45 – 10.30
Basics of SEM and EDX by José Alfonso Seisdedos Bayón, Director de Monocomp Instrumentación
10.30 – 11.00
Imaging surface topography: Understanding Atomic Force Microscopy (AFM) by Dr. Colin Grant, Hitachi SPM Sales & Applications Specialist
11.00 – 11.30
Coffee break
11.30 – 12.00
Hitachi’s wide varieties of SEM sample preparation methods and its applications by Mr. Yu Sugimoto Hitachi EM Sales Manager
12.00 – 12.30
Correlative Microscopy: Combined AFM & SEM for advanced materials characterisations by Dr. Colin Grant
12.30 – 13.15
Hitachi’s latest FE-SEM technology and its applications by Mr. Yu Sugimoto
13.15 – 13.30
Q&A/ Wrap-up

 Preu

Free access, registration required. Contact to:

Sr. Mario Seisdedos
Tel: +34 619 135 904
mario@monocomp-instrumentacion.com

 Dates

June 18th, 9:00 to 13:30h.

 Location

Aula dels CCiTUB
Centres Científics i Tecnològics
Universitat de Barcelona
C/ Solé i Sabarís 1-3, 08023 Barcelona


Organized by:

Centres Científics i Tecnològics
Universitat de Barcelona
Director: Dr. José Ramón Seoane Trigo

Coordinator:
Dra. Anna Vila
Transfer and National and International Relations of the CCiTUB.
HITACHI MONOCOMP









  





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