The upcoming edition of the ELECMI International Workshop will take place at the Scientific and Technological Centers of the Universitat de Barcelona (CCiTUB), one of the key nodes of ELECMI, the Spanish Infrastructure for Electron Microscopy of Materials, part of the national ICTS (Unique Scientific and Technical Infrastructures) map.
This in-person event is designed for researchers working with electron microscopy and scanning probe techniques, offering a unique opportunity to engage with leading experts in the field. Internationally renowned speakers, along with ELECMI researchers at the forefront of technical and methodological innovation, will share their latest findings and developments. The workshop will highlight the role of advanced microscopy as a fundamental tool for characterising both materials and soft matter at the highest spatial, energy, and time resolutions.
The scientific programme will cover key topics such as: 4D STEM, Scanning Probe and Dual-Beam Microscopy, Electron Energy Loss Spectroscopy (EELS) and In situ Electron Microscopy.
In addition, this edition will feature a dedicated poster session, allowing attendees to present their own scientific advances and promote active exchange within the research community.