4th ELECMI International Workshop

ELECMI is the Spanish Infrastructure for Electron Microscopy of Materials, a Unique Scientific and Technical Infrastructure (ICTS) within the current Map of National Facilities in Spain.

After the previous editions in the nodes of Zaragoza (2017, 2018) and Madrid (2019), this 4th ELECMI International Workshop is to be held in the node of Barcelona at the Scientific and Technological Centers of the Universitat de Barcelona (CCiTUB).

The workshop will be an in-person meeting for all researchers interested in electron and scanning probe microscopy techniques. Reputed international speakers and researchers from ELECMI, working at the forefront of technical and methodological developments in the field, will present their latest results aiming to illustrate the potential of these microscopy techniques as an essential tool for both materials and soft matter characterisation at ultimate spatial, energy or time resolutions.

Attendance to this workshop is free of charge, but registration is mandatory to help organizers with the logistics.

Topic 1

Transmission Electron Microscopy



Topic 2

Scanning Probe Microscopies



Topic 3

Scanning Electron Microscopy / Dual Beam




Ana M. Sánchez

Department of Physics
University of Warwick

Odile Stephan

Solid-state Physics Laboratory
Université Paris-Saclay

Lluís López

Centres Científics i Tecnològics Universitat de Barcelona

Mariano Barrado

Laboratory of Advanced Microscopies
University of Zaragoza


Jordi Benet

Institute of Chemical Research

Zhuoya Dong

Laboratory of Advanced Microscopies
University of Zaragoza

Cesar Magen

Laboratory of Advanced Microscopies
University of Zaragoza

Mathias O. Mosig



Bernat Mundet

Department of Quantum Matter Physics
University of Geneva

Stavros Nicolopoulos

NanoMegas SRPL

Sergi Plana

Scientific & Technical Resources
Universitat Rovira i Virgili

Eva Prats

Centres Científics i Tecnològics
Universitat de Barcelona


Sílvia Pujals

Institut Advanced Chemistry Catalonia

Isabel Rivas

Laboratory of Advanced Microscopies
University of Zaragoza

Lorena Ruíz-Pérez

Molecular Bionics Group

Gala Simón

Laboratory of Advanced Microscopies
University of Zaragoza


Susana Trasobares

Department of Materials Sciences and Metallurgical Engineering and Inorganic Chemistry
University of Cadiz

Gabriel Sánchez-Santolino

National Center of
Electron Microscopy
Universidad Complutense Madrid

José María Valpuesta

Centro Nacional de Biotecnología
President of the
European Microscopy Society

Francesca Peiró

Laboratory of Electron Nanoscopy
Universitat de Barcelona


Juan Fran Sangüesa

Centres Científics i Tecnològics de la Universitat de Barcelona


Tentative program, stay tuned



10:00 - 10:30 Reception

10:30 - 11:15 Welcome
Jordi García (Vice-Rector for Research, UB) - Eugeni Graugés i Pous (dean of Physics Faculty, UB) - Pilar Cea (ICTS ELECMI president) - Juan Fran Sangüesa (CCiTUB director, UB)

11:15 - 12:00 Plenary Talk 1
Odile Stephan ☛ Recent advances in spatially-resolved spectroscopy combining photon and monochromated electron beams in a STEM

12:00 - 12:30 Invited Talk 1.1
Cesar Magen ☛ Engineering polar states in multiferroic Sr1-xBaxMnO3 thin films

12:30 - 13:00 Invited Talk 1.2
Hugo Pérez ☛ MEMS-based In-situ Transmission Electron Microscopy: Exploring Untapped Opportunities in Battery Research, Catalysis and Electrochemistry (DENSsolutions)

13:00 - 13:30 Invited Talk 1.3
Stavros Nicolopoulos ☛ High Angle Liquid Cell TEM Tomography for In Situ Observation and 3D Reconstruction in Liquid

13:30 - 15:00 Lunch

15:00 - 15:45 Plenary Talk 2
Jose Maria Valpuesta ☛ Cryoelectron microscopy: a revolution in structural biology

15:45 - 16:15 Invited Talk 2.1
Lorena Ruíz-Pérez ☛ Structural Biology in the Liquid State: Amyloid-β40 aggregation visualised by Liquid-Phase TEM

16:15 - 16:45 Invited Talk 2.2
Eva Prats ☛ Cryo-CLEM with FIB-SEM for life science

16:45 - 17:15 Coffee Break

17:15 - 17:45 Invited Talk 2.3
Gala Simón ☛ What do historical bricks from Auschwitz, clothes with caffeine encapsulated and surgical masks against COVID-19 have in common?

17:45 - 18:15 Invited Talk 2.4
Sílvia Pujals Riatós ☛ Correlative super resolution and electron microscopy methods for nanomedicine

18:15 - 18:45 Invited Talk 2.5
Mariano Barrado ☛ Cryo-Dual Beam Applications



9:00 - 9:45 Plenary Talk 3
Ana M. Sánchez ☛ Electron microscopy of ferroelectric incommensurate spin crystals

9:45 - 10:15 Invited Talk 3.1
Bernat Mundet ☛ Structural and Electronic Couplings in Rare-earth Nickelate Superlattices

10:15 - 10:45 Invited Talk 3.2
Jordi Benet ☛ A new giants step in Crystallography: Structure Determination based on Electron Diffraction

10:45 - 11:15 Invited Talk 3.3
Sergi Plana Ruíz ☛ 3D Electron Diffraction: The TEM as an Electron Diffractometer for the Structural Characterization of Nanocrystals

11:15 - 11:45 Coffee Break

11:45 - 12:15 Invited Talk 3.4
Mathias O. Mosig ☛ AXON: An In-situ TEM Software Platform Streamlines Image Acquisition, Metadata Synchronization and Data Analysis, Enabling Deeper Understanding, and Improved Reproducibility of In-situ Experimental Results

12:15 - 12:45 Invited Talk 3.5
Lluís López-Conesa ☛ New TEM instrumentation and upgrades: present and future prospects at the Barcelona ELECMI node

12:45 - 13:15 Invited Talk 3.6
Zhuoya Dong ☛ Atomic-level handedness determination of chiral crystals using aberration-corrected scanning transmission electron microscopy

13:15 - 13:45 Invited Talk 3.7
JEOL ☛ New JEOL developments on cutting edge time resolved microscopy field

13:45 - 15:00 Lunch

15:00 - 15:30 Invited Talk 4.1
Susana Trasobares ☛ Advanced Electron microscopy; a perfect tool to elucidate the key role of atomically thin CeO2 surface layers on nanoparticles with applications in Energy and the encapsulation of bioactive natural products used as Green Agrochemicals

15:30 - 16:00 Invited Talk 4.2

16:00 - 16:30 Invited Talk 4.3
Isabel Rivas ☛ Magnetic deposits by FEBID

16:30 - 17:00 Invited Talk 4.4
Gabriel Sánchez Santolino ☛ Four-dimensional scanning transmission electron microscopy techniques for materials characterization

17:00 - 17:30 Invited Talk 4.5
Lluís Yedra Cardona ☛ TEM insight into defects in ionic conductor thin layers and their effect in fast transport

17:30 - 17:45 Concluding remarks


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