Centres Científics i Tecnològics UB

Secondary Ion Mass Spectrometry (SIMS)

Contact: info@ccit.ub.edu

Secondary Ion Mass Spectrometry (SIMS)
Analysis of in-depth homogeneity and composition in thin films.
Analysis of surface composition.
Analysis of trace and doping in semiconductors as a function of depth.
Detection of impurities in thin films or volume.
Verify the composition profile of an implantation of B in c-Si.
Check homogeneity of elements in thin films of micro-crystalline C.
Study of elements diffusion at the interface of amorphous Si thin films.
Analysis of the periodicity of multi-layer metal Cr / CrC.
Determination of contaminants in photovoltaic solar cells.

Surname Name Location Phone number Fax Email
LOPEZ FERNANDEZ (*) FRANCISCO Fac. Química C/ Martí i Franquès, 1 934021134 934021138 franlopez@ccit.ub.edu


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